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2947 ERGEBNISSE GEFUNDEN FÜR: benutzt Final Test

1 2 3 4 5 6 Nächster
  • HITACHI: RS7000-30

    tester 2 left, 2 right Software version 7.29 Controller labeler Loader / unloader conveyor: stacker Warehoused.
  • HITACHI: RS7000-30

    tester 2 left, 2 right Software version 5.31 Controller labeler Loader / unloader conveyor: short Warehoused 1997 vintage.
  • ADVANTEST: 5365

    Memory test system.
  • ADVANTEST T 5335P

    ADVANTEST: T 5335P

    Memory test systems Configuration: CONFIGURATION OF TEST HEAD NUMBER OF TEST HEAD [1,2] ...........................> 2 CONFIGURATION OF TEST HEAD 1 TEST HEAD TYPE 1.650CH 2.1300CH [1,2] .....................> 1 PIN CONFIGURATION SLOT NO. [33,97,41,105] CHILD A ....> 33,41,97,105 CHILD B ....> 33,41,97,105 CHILD C ....> 33,41,97,105 CHILD D ....> 33,41,97,105 PIN CONFIGURATION OPTION1 PIN CARD [Y,N] CHILD A ....> YES CHILD B ....> YES CHILD C ....> YES CHILD D ....> YES PIN CONFIGURATION OPTION2 PIN CARD [Y,N] CHILD AB ...> YES CHILD CD ...> YES BYPASS CAPACITOR TO 10V/16V PPS (PCON) 1.NON-EXISTENT 2. EXISTENT [1,2] ..............> 1 BYPASS CAPACITOR TO HV PPS (PCON) 1.NON-EXISTENT 2. EXISTENT [1,2] ..............> 1 CONFIGURATION OF TEST HEAD 2 TEST HEAD TYPE 1.650CH 2.1300CH [1,2] .....................> 1 PIN CONFIGURATION SLOT NO. [33,97,41,105] CHILD A ....> 33,41,97,105 CHILD B ....> 33,41,97,105 CHILD C ....> 33,41,97,105 CHILD D ....> 33,41,97,105 PIN CONFIGURATION OPTION1 PIN CARD [Y,N] CHILD A ....> YES CHILD B ....> YES CHILD C ....> YES CHILD D ....> YES PIN CONFIGURATION OPTION2 PIN CARD [Y,N] CHILD AB ...> YES CHILD CD ...> YES BYPASS CAPACITOR TO 10V/16V PPS (PCON) 1.NON-EXISTENT 2. EXISTENT [1,2] ..............> 1 BYPASS CAPACITOR TO HV PPS (PCON) 1.NON-EXISTENT 2. EXISTENT [1,2] ..............> 1 CONFIGURATION OF DPU 1'ST DPU : STN 1,2 [Y,N] ..........................> YES 2'ND DPU : STN 1,2 [Y,N] ..........................> NO TEST HEAD 1 DC CONFIGURATION [1-16] .............> 1-16 10V PPS CONFIGURATION [1-32] .............> 1-32 16V PPS CONFIGURATION [17-32] ............> HV PPS CONFIGURATION [1-4] .............> TEST HEAD 2 DC CONFIGURATION [1-16] .............> 1-16 10V PPS CONFIGURATION [1-32] .............> 1-32 16V PPS CONFIGURATION [17-32] ............> HV PPS CONFIGURATION [1-4] .............> 1'ST GPIB I/F BOARD 0.NONE 1.BGR-010944X01 2.BGR-010944X02 3.BGR-010944X03 4.BGR-010944X04 5.BGK-012718 [0-5] .........> 0 2'ND GPIB I/F BOARD 0.NONE 1.BGR-016793 (DPU I/F) 2.BGR-010944X05 3.BGK-012718X02 [0-3] .........> 1 DMM TYPE 1.TR6861 2.R6871E 3.R6551 4.R6552T [1-4] .........> 4 AC FREQUENCY (HERTZ) [50,60] ........................> 60 CONFIGURATION OF FM NUMBER OF FM BOARD [0-4] .........> 4 SIZE OF FM MODULE 1. 1M 2. 4M 3. 8M [1-3] .........> 1 NUMBER OF MEMORY BANK [1-2] .........> 1 NUMBER OF MEMORY BLOCK [1-4] .........> 4 PATTERN MEMORY [Y,N] .........> NO FM BOARD KIND 1. BGR-020816 2. BGR-020816X02 [1-2] ..............> 2 CONFIGURATION OF MRA MRA2/3 OPTION [Y,N] ...........................> YES MRA OPTION TYPE [2,3] (2=MRA2,3=MRA3) ...........> 2 TYPE OF CBU BOARD [1,2] (1: BGR-019267 ) (2: BGR-019267X02) ....> 1 NUMBER OF CBU BOARD [1,2,3,4] .......................> 2 TYPE OF FBM BOARD [1,2,3,4] (1= 4M*36BIT) (2= 4M*72BIT) (3= 8M*72BIT) (4=16M*72BIT) .........> 3 NUMBER OF FBM BOARD [1-4] ...........................> 4 COMPRESSION FUNCTION [Y,N] ...........................> NO CONFIGURATION OF FCDC FLASH OPTION [Y,N] ...........................> YES SC BOARD KIND 1. BGR-020774 2. BGR-020774X02 [1-2] ..............> 1 Currently stored in a warehouse 1997 vintage.
  • ADVANTEST: T 2000SP

    Tester Frequency: 125 ~ 250 MHz 250M DM: (2) 64 pin 125M DM: (23) 736 pin 250M Pattern Depth: 128 MW 125M Pattern Depth: 128 MW DPS: LCDPS: (2) 4A x 8 ch HCDPS: (2) 16A x 4 ch.
  • TERADYNE: CATALYST

    Mixed signal test systems.
  • LTX-CREDENCE: SC 212

    VLSI test systems.
  • PRECISION SERVICES PT-3A
  • ADVANTEST: T 5382

    Memory tester.
  • LORLIN: I500

    Discrete Semiconductor Test System, as-is.
  • LTX-CREDENCE: ASL-3000

    Lot of Parts: (2) MDI (1) AWG.
  • -: -

    Lot of 949-921-01 Boards for a TERADYNE Catalyst tester (Qty 24 pcs).
  • MOSAID MS 4205EX

    MOSAID: MS 4205EX

    Bench tester Configuration: AYRU: 2 DYRU: 6 FPGN: 4 CLMP: 1 TGNY: 1 TIFC: 1 DDCF: 1 Pin Card 1003035C-00: 12.
  • MICROHANDLING MH245

    MICROHANDLING: MH245

    Test handlers Configuration Available: SOIC150mil Standard contact Ambient and hot test Input / Output is Tube to Tube The Handler can be directly docked to the Tester.
  • ADVANTEST T 5581 H

    ADVANTEST: T 5581 H

    Memory tester Includes (2) M6741A handlers Configuration: CONFIGURATION OF TEST HEAD PIN CONFIGURATION 1.640DR+288I/O 2.960DR+288I/O 3.640DR+576I/O 4.960DR+576I/O [1-4] ............> 4 TH CABLE LENGTH 1.5M 2.8M [1,2] ......................> 1 NUMBER OF TEST HEAD [1,2] ...........................> 2 CONFIGURATION OF TEST HEAD 1 TEST HEAD TYPE 1.816CH 2.1600CH [1,2] .....................> 2 PE BOARD TYPE 0.NO BOARD 1.BGM-021633 (FULL PE) 2.BGM-021633X02 (I/O PE) 3.BGM-021633X03 (DR PE) SLOT 33 36 39 161 164 167 CHILD A ....> 1 1 1 1 1 1 CHILD B ....> 1 1 1 1 1 1 CHILD C ....> 1 1 1 1 1 1 CHILD D ....> 1 1 1 1 1 1 CHILD E ....> 1 1 1 1 1 1 CHILD F ....> 1 1 1 1 1 1 CHILD G ....> 1 1 1 1 1 1 CHILD H ....> 1 1 1 1 1 1 CONFIGURATION OF TEST HEAD 2 TEST HEAD TYPE 1.816CH 2.1600CH [1,2] .....................> 2 PE BOARD TYPE 0.NO BOARD 1.BGM-021633 (FULL PE) 2.BGM-021633X02 (I/O PE) 3.BGM-021633X03 (DR PE) SLOT 33 36 39 161 164 167 CHILD A ....> 1 1 1 1 1 1 CHILD B ....> 1 1 1 1 1 1 CHILD C ....> 1 1 1 1 1 1 CHILD D ....> 1 1 1 1 1 1 CHILD E ....> 1 1 1 1 1 1 CHILD F ....> 1 1 1 1 1 1 CHILD G ....> 1 1 1 1 1 1 CHILD H ....> 1 1 1 1 1 1 CONFIGURATION OF DPU 1'ST DPU : STN 1,2 [Y,N] ..........................> YES 2'ND DPU : STN 1,2 [Y,N] ..........................> YES TEST HEAD 1 DC CONFIGURATION [1-32] .............> 1-32 10V PPS SPEC [1,2] (1:0.4A 2:0.8A) ......> 2 10V PPS CONFIGURATION [1-64] .............> 1-64 16V PPS CONFIGURATION [33-64] ............> HV PPS CONFIGURATION [1-4] .............> 1-4 TEST HEAD 2 DC CONFIGURATION [1-32] .............> 1-32 10V PPS SPEC [1,2] (1:0.4A 2:0.8A) ......> 2 10V PPS CONFIGURATION [1-64] .............> 1-64 16V PPS CONFIGURATION [33-64] ............> HV PPS CONFIGURATION [1-4] .............> 1-4 1'ST GPIB I/F BOARD 0.NONE 1.BGR-010944X01 2.BGR-010944X02 3.BGR-010944X03 4.BGR-010944X04 5.BGK-012718 [0-5] .........> 0 2'ND GPIB I/F BOARD 0.NONE 1.BGR-016793 (DPU I/F) 2.BGR-010944X05 3.BGK-012718X02 [0-3] .........> 1 DMM TYPE 1.TR6861 2.R6871E 3.R6551 4.R6552T [1-4] .........> 4 AC FREQUENCY (Hz) [50,60] ........................> 60 CONFIGURATION OF ALPG NUMBER OF ALPG [1,2,4] ..............................> 2 CONFIGURATION OF DBM DBM OPTION EXIST [Y,N] ..............................> NO SIZE OF DBM BOARD ....................................> CONFIGURATION OF FM NUMBER OF FM BOARD [0-4] ............................> 0 PATTERN MEMORY(PM) BOARD EXIST [Y,N] ................> NO CONFIGURATION OF MRA MRA2/3 OPTION [Y,N] ...........................> NO CONFIGURATION OF FCDC PIN PATTERN OPTION [Y,N] ...........................> NO PIN DRE OPTION [Y,N] ...........................> NO PIN CPE OPTION [Y,N] ...........................> NO 1997 vintage.
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