Gebraucht PHILIPS / FEI Helios NanoLab 660 #293755398 zu verkaufen

Dual beam Focused Ion Beam Scanning Electron Microscope (FIB-SEM) Dedicated microscope controller ELSTAR Electron column with UC technology Tomahawk ion column with fast ion beam blanker Electron beam deceleration In-lens detector TLD with SE and BSED modes Secondary electron detector (SED) In-column detectors: ICD and Mirror detector Beam current measurement CCD IR Camera Integrated plasma cleaner Oil-free pumping system Large table top with support Eucentric stage: 150 x 150 mm P/N: 1011754, MULTIGIS P/N: 1201266, NAV-Cam P/N: 1080391, HELIOS NANOLAB 660 P/N: 9432 023 03091, ICE Detector, Helios SDB P/N: 9432 069 03141, Retractable annular STEM P/N: 1033506, Easy lift PC (2) LCD monitor, 24" (widescreen) Operating system: Windows 7.