Gebraucht PHILIPS / FEI Quanta 3D FEG #293764147 zu verkaufen

Dual beam Scanning Electron Microscope (SEM) Ion column side winder Ion column side winder maximaum beam current: 65 nA Resolution: < 7nm at 30 kV FEG NG Column FEG Column resolution: < 1.2nm at 30 kV Operating system: Windows XP.