Gebraucht PHILIPS / FEI Versa 3D #293670274 zu verkaufen

Scanning Electron Microscope (SEM) Detectors: ETD, ICE, STEM Electron column Schottky NG FEG SEM KV Range: 350 V-30 keV E-Beam deceleration E-Beam fast blanker Nanomanipulator with rotation Plasma cleaner Cryo-cold trap IR Camera Navigation camera Low vacuum and high vacuum modes HT ION Column: 65 nA Stage: Hot / Cold Scios holder Gas injection system: Pt, Carbon, IEE Microscope control: Auto slice Auto TEM No eazy lift exchange No OXFORD EDS Detector No OXFORD EBSD Detector No cold trap Operating system: Windows 7 2010 vintage.