Gebraucht TESCAN XEIA 3 #293750876 zu verkaufen

Focused Ion Beam (FIB) system Electron gun high brightness schottky emitter Rotation: 360° Resolution: In-Beam SE: 0.7 nm at 15 keV, 1.4 nm at 1 keV / 1.0 nm at 1 keV, 1.7 nm at 500 eV / 1.2 nm at 200 eV In-Beam LE-BSE: 1.6 nm at 15 keV Low vacuum mode: BSE: 2.0 nm at 30 keV Maximum field of view: 4.3 mm at WD 5 mm, 7.5 mm at WD 30 mm Electron beam energy: 200 eV to 30 keV / down to 50 eV with BDT option Probe current: 2 pA to 400 nA 2016 vintage.