Gebraucht PHYSICAL ELECTRONICS / PHI / PERKIN ELMER PHI-670Xi #293763662 zu verkaufen

Scanning auger electron microscope nanoprobe system Schottky field emission source Multi-channel detector Beam voltage: 0.1 to 25 keV Image shift: ±150 µm Sample translation: X-Axis: ±10 mm Y-Axis: ±10 mm Z-Axis: ±5 mm Tilt: 60° Dry nitrogen: 0.21 Bar Compressed air: 8 Bar Power supply: 200-240 VAC, Single phase, 60 A, 50/60 Hz 1993 vintage.