Gebraucht PERKIN ELMER Lambda 950 #9119552 zu verkaufen

Spectrometer P/N: L6020036 Lambda 950 STD Detector Assy Polarizer Assy-L900 Software: (UV Winlab 5.2.0 / Accessory software UV Winlab V1.1.3 / Software utilities Ver 7.00) Bandwidth: 0.05 nm - 5.00 nm in 0.01 nm increments UV/Vis range 0.20 nm - 20.00 nm in 0.04 nm increments NIR range Fixed resolution, constant energy or slit programming Light Source: Pre-aligned tungsten-halogen and deuterium Optics: Split Beam Photodetector: photomultiplier Photometric Range UV/Vis: 8 A NIR: 6 A Wavelength Range: 175 to 900 nm N2 purge required below 185 nm Power Requirements: 90 VAC - 250 VAC, 50/60 Hz; 250 VA Beam Splitting System: Chopper (46+ Hz, Cycle: Dark/Sample/ Dark/Reference, Chopper Segment Signal Correction) UV/Vis resolution: 2 A At 220 nm, 10 g/l NaI ASTM method: At 340 nm, 50 mg/l NaNO2 ASTM method: At 370 nm, 50 mg/l NaNO2 ASTM method: At 1420 nm, H20 1 cm path length: At 2365 nm, CHCl3 1 cm path length: Wavelength accuracy: UV/Vis: ± 0.080 nm NIR: ± 0.300 nm Wavelength reproducibility: UV/Vis (Deuterium lamp lines) NIR (Deuterium lamp lines) Standard deviation of 10 measurements UV/Vis Standard deviation of 10 measurements NIR Photometric accuracy: Double Aperture Method 1 A: ± 0.0006 A Double Aperture Method 0.5 A; ± 0.0003 A NIST 1930D Filters 2 A: ± 0.0030 A NIST 930D Filters 1 A: ± 0.0030 A NIST 930D Filters 0.5 A: ± 0.0020 A K2Cr2O7-Solution USP/DAP method: ± 0.0080 A Photometric linearity: Addition of filters UV/Vis at 546.1 nm, 2 nm slit, 1 second integration time At 1.0 A: ± 0.0060 A At 2.0 A: ± 0.0160 A At 3.0 A: ± 0.0050 A Photometric reproducibility Standard deviation for 10 measurements, 2 nm slit, 1 second integration time 1 A with NIST 930D Filter at 546.1 nm: = 0.00016 A 0.5 A with NIST 930D Filter at 546.1 nm: = 0.00008 A 0.3 A with NIST 930D Filter at 546.1 nm: = 0.00008 A Photometric display: Unlimited Photometric stability: After warm-up at 500 nm, 0 A, 2 nm slit, 2 second integration time, peak to peak: = 0.0002 A/h Baseline flatness: 190 nm - 3100 nm, 2 nm slit 0.20 second integration time UV/Vis, no smoothing applied 0.24 second integration time NIR, no smoothing applied: ± 0.0008 A Purging: Optics: Yes Sample compartment: Yes Light beam: 90 mm above the base plate 120 mm beam separation 3 mm - 12 mm beam height.