Gebraucht BOWMAN BA 100 #293750006 zu verkaufen

X-Ray fluorescence spectrometer Silicon Drift Detector (SDD) CU Standards: 0.1 μm, 0.5 μm, 5 μm, 10 μm S29X CU Foil: 0.75 μ Custom Ag Foil: 50 Angstroms Custom Au Foil: 200 nm INF Card Au/Ni Plated (0.1 μm) Custom Ag/Cu Plated Custom Pd/Cu Plated Foils: Ni: 2 μin Pd: 2 μin Ag: 10 μin (0.25 μm) Pd: 10 μin (0.25 μm) Ru: 20 μin (0.5 μm) Sn: 400 μin (10 μm) Sn: 40 μin (1μm).