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ADVANTEST
T 5581H
Memory Test systems, 8" Configuration: CBOX I/F PE PIN: 960DR+576I/O Test Head Type: 1600CH 2’ND G
7
ADVANTEST
T 5581H
Memory Testers Configuration: CONFIGURATION OF TEST HEAD PIN CONFIGURATION 1.640DR+288I/O 2
3
ADVANTEST
T 5581H
Memory tester Includes (2) M6741A handlers Configuration: CONFIGURATION OF TEST HEAD PIN CONFIGURAT
6
ADVANTEST
T 5581H
Tester, parts system 250 MHz TH's Damaged parts: Main AC Pin cards Missing parts: MF Boards.
5
ADVANTEST
T 5581H
Memory tester PIN CONFIGURATION 1.640DR+288I/O 2.960DR+288I/O 3.640DR+576I/O 4.960DR+576I/O [1-4] .
6
ADVANTEST
T 5581H
Tester Dual head system Includes: (2) M6741 Handlers System configuration generate Configurat
6
ADVANTEST
T 5581H
Memory tester 250 MHz Configuration of test head: Pin configuration: 1.640DR+288I/O 2.960DR+288I/O
5
Beliebtes Produkt
ADVANTEST
T 5581H
Tester Dual head system Includes: (2) M6741 Handlers System configuration generate Configurat
14
ADVANTEST
T 5581H
Memory tester 576 Channel 250MHz Dual head tester Dual station SDR / DDR / DDR2 1998 vintage.
5
ADVANTEST
T 5581H
Memory test system Dual head tester Dual station Frequency: 250 MHz Tester channels: Drivers: 960
8
ADVANTEST
T 5581H
Memory test system Dual test head system No handlers included Currently powered up 1999 vintage.
5
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