Gebraucht VARIOUS Lot of equipment #9278739 zu verkaufen

Qty / Make / Model / Description / Vintage (2) / NIKON / NSR 2205 i12D / Steppers / 1995 (1) / FSI / TEL / TOKYO ELECTRON / Mercury / Spray cleaning system / 1984 (1) / FSI / TEL / TOKYO ELECTRON / Mercury MP / Spray cleaning system / 1984 (1) / VARIAN / E220 / Medium current ion implanter / 1995 (1) / EATON NOVA / AXCELIS / NV-GSD 200 / High current implanter / 1995 (1) / LAM RESEARCH / Alliance 4520 XLE / Etcher / - (1) / LAM RESEARCH / Alliance 4420 / Etcher / 1994 (1) / AMAT / APPLIED MATERIALS / Endura 5500 / PVD System / 1998 (1) / DISCO / DFG 8540 / Back grinder / 2012 (1) / DISCO / DFD 6341 / Dicer / 2012 (1) / KLA / TENCOR / 8100 / Critical Dimension Scanning Electron Microscopes (CD-SEM) / - (1) / KLA / TENCOR / 8100XP / Critical Dimension Scanning Electron Microscopes (CD-SEM) / 1998 (1) / KLA / TENCOR / 6100 Surfscan / Surface inspection system / 1987 (1) / KLA / TENCOR / 6100 Surfscan / Surface inspection system / 1990 (1) / AG ASSOCIATES / 8108 / Rapid Thermal Processor (RTP) / 1995 (1) / LAM RESEARCH / 4520IS / Etcher / 1995 (1) / LAM RESEARCH / TCP 9600 / Metal etcher / 1993 (1) / AMAT / APPLIED MATERIALS / P5000 / Nitride / Oxide etcher / - (1) / AG ASSOCIATES / 8100 / Rapid Thermal Processor (RTP) / 1991 (1) / AMAT / APPLIED MATERIALS / P5000 / WCVD / 1994 (2) / NOVELLUS / Concept One / Systems / - (1) / KLA / TENCOR / PROMETRIX / RS75 / System / - (1) / AXCELIS / FUSION / 150PC / Photostabilizer / 1987 (2) / SVG / ASML / 90 Series / Track systems / 1995 (1) / KLA / TENCOR / PROMETRIX / UV 1050 / Thin film measurement system / 1993 (1) / SEMITOOL / 870S / Spin Rinse Dryer (SRD) / 1995 (1) / SEMITOOL / 870S / Spin Rinse Dryer (SRD) / 1998 (1) / SEMITOOL / 870S / Spin Rinse Dryer (SRD) / 1995 (1) / SEMITOOL / Sirius / Hydrozone system / 2004 (1) / KLA / TENCOR / PROMETRIX / Omnimap RS-35C / Mapping system / 1994 (1) / KLA / TENCOR / PROMETRIX / UV 1050 / Film thickness measurement system / - (1) / KLA / TENCOR / FLX 2320 / Thin film stress measurement system / 1992 (1) / MATRIX / 106 / Asher / 1994 (2) / TEGAL / 965 / Etchers / 1984 (1) / TEGAL / 965 / Etcher / 1984 (1) / NICOLET / ECO 1000S / FTIR Wafer analysis system / 1998 (1) / WENTWORTH / Pegasus / Prober, B1500 Tester / 2011 (2) / ELECTROGLAS / EG600T / Probers / 2013 (1) / KLA / TENCOR / 5200 / Overlay measurement system / 1999 (1) / KLA / TENCOR / 2123 / Patterned wafer inspection system / 1995 (1) / SEMITOOL / SST‐C‐641‐270‐P / Solvent system, 6" / 1995 (1) / REEDHOLM / LOMAC / RI40 / Tester / 1992 (1) / SEMILAB / WT-2000 / Tester / 2011 (2) / ELECTROGLAS / Horizon 4085X / Automatic probers / 2000 (1) / ZEISS / 960312‐20513 / Microscope / - (1) / SPEC / SBXAT13‐30 / Automatic solvent station / 1999 (1) / VERTEQ / ST600‐42TL / Megasonic cleaner / 1993 (1) / DNS / DAINIPPON / - / Megasonic cleaner / 1994 (1) / GSI LUMONICS / WaferMark 345-2 / Laser scribe / 1995 (1) / JST / SA00I0R0 / Cleaner with CLV dryer / 2008 (1) / JST / SA00IIR0 / Etcher with CLV dryer / 2008 (1) / JST / SA00I2R0 / Etcher / 2008 (1) / ZEISS / MVT-1060 / Microscope, FEOL / 1996 (1) / ZEISS / MVT-1060 / Microscope, BEOL / 1996 (1) / MDC / Plotter with autoloader probe station / 1997 (3) / MACTRONIX / - / Wafer transfers / 2000 (4) / MRL / Cyclone C440 / Four tube furnaces / 1997 (4) / EDWARDS / - / Abatement systems / 2010 (1) / SEMIX / TAZMO / TR 6132UD / System / 1982 (1) / JST / - / Quartz cleaner / 2008 (1) / RUDOLPH / FOCUS FE III / Ellipsometer / 1980 (5) / MACTRONIX / - / Wafer transfers / - (2) / ZEISS / - / Microscopes / - (1) / KLA / TENCOR / PROMETRIX / SM 300 / Film thickness mapping system / - (1) / TERRA UNIVERSAL / - / Wafer box desiccator / - (1) / KLA / TENCOR / M-Gage 200 / Thickness measurement system / - (1) / REEDHOLM / LOMAC / RI20 / Tester / 1989 (1) / BLUE M / - / Oven for EEPROM burn-in (1) / KEITHLEY / S530 / System / - (1) / POWATEC / P200 / Wafer mounter / 2012 (1) / POWATEC / U200 / UV Cure / 2012 (1) / E+H METROLOGY / - / Wafer thickness gauge / 2012 (1) / POWATEC / L200 / Wafer laminator / 2012.