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TERADYNE
J973
Testers Tester Computer: Sun ultra 2 383 Pins AXF 0: DC PWR AXF SLOT 1: MAC FAN AXF SLOT 6: PMU AXF
3
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Beliebtes Produkt
TERADYNE
J973
Tester, 8"-12" Process application: Wafer sort Copper process Batch / Single wafer: 25" Features 51
76
Beliebtes Produkt
TERADYNE
J973
Tester, 8"-12" Process application: Wafer sort Copper process Batch / Single wafer: 25" Features 51
64
Beliebtes Produkt
TERADYNE
J973
Tester, 8"-12" Process application: Wafer sort Copper process Batch / Single wafer: 25" Features 51
76
Beliebtes Produkt
TERADYNE
J973
Tester, 8"-12" Process application: Wafer sort Copper process Batch / Single wafer: 25" Features 51
93
Beliebtes Produkt
TERADYNE
J973
Tester, 8"-12" Process application: Wafer sort Copper process Batch / Single wafer: 25" Features 51
65
Beliebtes Produkt
TERADYNE
J973
Tester, 8"-12" Process application: Wafer sort Copper process Batch / Single wafer: 25" Features 51
68
Beliebtes Produkt
TERADYNE
J973
Tester, 8"-12" Process application: Wafer sort Copper process Batch / Single wafer: 25" Features 51
77
Beliebtes Produkt
TERADYNE
J973
Tester, 8"-12" Process application: Wafer sort Copper process Batch / Single wafer: 25" Features 51
75
Beliebtes Produkt
TERADYNE
J973
Back plane, 950-835-00 & 950-984-01 Module printed circuit board.
70
Beliebtes Produkt
TERADYNE
J973
Test System J973-400AP VLSI Test System Includes: - Mainframe for channels 1-512 at 150ps edge
84
