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Beliebtes Produkt
TERADYNE
J973
Tester, 8"-12" Process application: Wafer sort Copper process Batch / Single wafer: 25" Features 51
332
Beliebtes Produkt
TERADYNE
J973
Tester, 8"-12" Process application: Wafer sort Copper process Batch / Single wafer: 25" Features 51
267
Beliebtes Produkt
TERADYNE
J973
Tester, 8"-12" Process application: Wafer sort Copper process Batch / Single wafer: 25" Features 51
286
Beliebtes Produkt
TERADYNE
J973
Tester, 8"-12" Process application: Wafer sort Copper process Batch / Single wafer: 25" Features 51
322
Beliebtes Produkt
TERADYNE
J973
Tester, 8"-12" Process application: Wafer sort Copper process Batch / Single wafer: 25" Features 51
294
Beliebtes Produkt
TERADYNE
J973
Tester, 8"-12" Process application: Wafer sort Copper process Batch / Single wafer: 25" Features 51
270
Beliebtes Produkt
TERADYNE
J973
Tester, 8"-12" Process application: Wafer sort Copper process Batch / Single wafer: 25" Features 51
302
Beliebtes Produkt
TERADYNE
J973
Tester, 8"-12" Process application: Wafer sort Copper process Batch / Single wafer: 25" Features 51
300
Beliebtes Produkt
TERADYNE
J973
Back plane, 950-835-00 & 950-984-01 Module printed circuit board.
292
Beliebtes Produkt
TERADYNE
J973
Test System J973-400AP VLSI Test System Includes: - Mainframe for channels 1-512 at 150ps edge
338
