Gebraucht HITACHI CG 4000 zu verkaufen

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HITACHI

Modell

CG 4000

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Scanning Electron Microscope (SEM) 2007 vintage.

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Scanning Electron Microscope (SEM), 12" (3) Load Ports Hard Disk Drive (HDD) Options: SECS Accessor

Scanning Electron Microscope (SEM) Resolution: 1.8 nm Throughput: 36 Wafer/hour MAM Time: 3.4s Stage

Scanning Electron Microscope (SEM).

Scanning Electron Microscope (SEM).

Critical Dimension Scanning Electron Microscope (CD-SEM) Process: Metrology HITACHI HJ-2010-NOSEA Ho

Beliebtes Produkt

Scanning Electron Microscope (SEM), 12" (2) Load Ports Hard Disk Drive (HDD) Options: SECS Accessor

Critical Dimension Scanning Electron Microscope (CD-SEM), 12" Hard Disk Drive (HDD) 2007 vintage.

Scanning Electron Microscope (SEM).

Beliebtes Produkt

Critical Dimension Scanning Electron Microscope (CD-SEM).