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Beliebtes Produkt
ADVANTEST
T 5375
Tester Single head /DIAG/G SYSTEM CONFIGURATION GENERATE CONFIGURATION OF TEST HEAD PIN CONFIGURAT
97
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ADVANTEST
T 5375
Memory tester With test head CONFIGURATION OF TEST HEAD PIN CONFIGURATION 1.512DR+ 320I/O(QUARTER)
107
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ADVANTEST
T 5375
Memory tester With test head CONFIGURATION OF TEST HEAD PIN CONFIGURATION 1.512DR+ 320I/O(QUARTER)
106
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ADVANTEST
T 5375
Tester Number of test head: 1 Configuration of test head Pin configuration 512DR+ 320I / O (quarte
92
Beliebtes Produkt
ADVANTEST
T 5375
Dual head tester /DIAG/G SYSTEM CONFIGURATION GENERATE CONFIGURATION OF TEST HEAD PIN CONFIGURAT
95
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ADVANTEST
T 5375
Memory tester Pin: 2048DR+1280 I/O (Full) Single head DC: 1-36 CH PPS: 1-256 CH AC Frequency: 60Hz F
80
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ADVANTEST
T 5375
Tester Configuration of test head: Pin configuration: 1. 512DR+ 320I/O(QUARTER) 2.1024DR+ 640I/O(
96
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ADVANTEST
T 5375
Memory test system with Flash option and M6771 handlers = /DIAG/R [2J[1;1HBOARD-NAME/REVISION PROCES
103
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ADVANTEST
T 5375
Memory tester FMRA and flash option Does not include PM board.
81
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ADVANTEST
T 5375
Memory tester Test station 3712 Channels Dr: 2048 Channels I/O: 1280 Channels DC: 128 Channels LVDr:
84
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ADVANTEST
T 5375
Memory tester, parts system (2) Test heads Flash option (16) FMRA (BIR-026382X02) PM (BIR-026383) TH
86
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ADVANTEST
T 5375
Memory test system (2) ADVANTEST M 6771AD handlers Full options Configuration: = /DIAG/G SYSTEM
81
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ADVANTEST
T 5375
Memory tester Pin: 2048DR+1280 I/O(Full) Single head DC: 1-36CH PPS: 1-256CH AC Frequency: 60Hz Flas
104
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ADVANTEST
T 5375
Dual head tester SYSTEM CONFIGURATION GENERATE CONFIGURATION OF TEST HEAD PIN CONFIGURATION 1. 512D
85
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ADVANTEST
T 5375
Memory testers SYSTEM CONFIGURATION GENERATE CONFIGURATION OF TEST HEAD PIN CONFIGURATION 1.51
87
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